Applied Scanning Probe Methods by Professor Bharat Bhushan, Professor Dr. Harald Fuchs,

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By Professor Bharat Bhushan, Professor Dr. Harald Fuchs, Professor Dr. Sumio Hosaka (auth.)

This quantity examines the actual and technical starting place for fresh development in utilized near-field scanning probe options. It constitutes a well timed entire evaluation of SPM purposes, now that business functions span topographic and dynamical floor experiences of thin-film semiconductors, polymers, paper, ceramics, and magnetic and organic fabrics. After laying the theoretical historical past of static and dynamic strength microscopies, together with sensor know-how and tip characterization, contributions element functions corresponding to macro- and nanotribology, polymer surfaces, and roughness investigations. the ultimate half on commercial learn addresses specific functions of scanning strength nanoprobes equivalent to atomic manipulation and floor amendment, in addition to unmarried electron units in accordance with SPM. Scientists and engineers both utilizing or making plans to exploit SPM concepts will enjoy the foreign point of view assembled within the book.

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Unfortunately, it has the drawbacks of the static mode, namely that stiff spring constants must be used and therefore the sensitivity of the deflection measurement must be very good, typically employing a high-resolution interferometer. 1 nm) a direct interpretation of the experiments is possible. 16) In effect, the modulated AFM in contrast to the purely static AFM can enhance sensitivity due to the use oflock-in techniques, which allows one to measure amplitude and phase of the oscillation signal with high precision.

The distance between tip and sample is therefore reduced as well, and the self-amplifying effect with the sudden in- 1 Dynamic Force Microscopy 17 0= 1")':' s:::: o oE C\l1/I o Q. l-TJ~ 8° ~: l! () 8 C') '" '" '" ! 1 oE 1")':' _-01 ~ -"0 C\I II 8° v 8 I ON J 0 '

The behavior of the cantilever can be subdivided into three different regimes. l Clearly, Fig. 9 exhibits more features than were anticipated from the initial simple arguments. Amplitude and phase seem to change rather abruptly at certain 1 In the following we will refer to Wo as the resonant frequency, although the correct resonant frequency is w~, if the finite Q-value is taken into account. 16 Fig. S. Force curves and corresponding contact radius calculated with the MYDI BHW-model as a function of tip radius for a Si-Si contact.

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